| Application Note C02: Crystallite Size and Microstrain Analysis of Pyrolytic Carbon or Graphite StructuresCrystallites are coherent (free of defects) crystal units that diffract in phase. The crystallite size is a measurement of adjacent, repeating crystalline units. The term Crystallite size is commonly substituted for the term particle size, in powder samples. The terms are only interchangeable when the particle size is less than 0.1µm or 1000A. When this occurs, the particle size and crystallite size are equal MORE INFORMATION >>. |
Application Note G01: General XRD Phase/Composition IdentificationGeneral X-ray diffraction phase/composition identification will distinguish the major, minor, and trace compounds present in a sample. The data usually includes mineral (common) name of the substance, chemical formula, crystalline system, and reference pattern number from the ICDD International database. A summary table of analysis results and diffraction plot with reference pattern markers for visual comparison is shown below: MORE INFORMATION >>. |
| Application Note G02: Texture/Orientation Distribution Function (ODF) of Rolled AluminumThe purpose of this study was to discover the subtle differences between texture direction and strength on two Aluminum Foil samples processed under slightly different conditions. The foil samples exhibit generally typical rolling texture, but, as seen in the following data, the ODF analysis shows minor yet important differences between the two samples, which can relate to performance (strength and rigidity) along a specific sample direction. MORE INFORMATION >> |
Application Note G03: Semi-Quantitative Analysis - using the RIR method Semi-quantitative analysis uses literature reference intensities in order to provide a quantitative measurement of the phases present in a sample. This method is used if it is not possible or impractical to set up a series or standards in a matrix simi liar to an unknown.More Information>> |
| Application Note M01: MicrodiffractionMicrodiffraction is X-ray diffraction analysis performed on small samples or small areas of large samples. Microdiffraction is considered the technique of choice when samples are too small for the optics and accuracy of conventional diffraction instrumentation. The microbeam is used as an X-ray probe so that diffraction characteristics can be mapped as a function of sample position. With the ability to accurately and precisely position the X-ray beam on a sample surface, the information can be plotted as a diffraction function map (DFM). Diffraction data can contain information about compound identification, crystallite orientation (texture), stress, crystallinity, and crystallite size. |
Application Note M02: X-ray Microdiffraction for Residual Stress Determination X-ray diffraction provides a direct measurement of residual strain on a material by directly measuring the expansion or compression of lattice plane spacings in the grains of the material. X-ray diffraction is a non-destructive and widely accepted method for the measurement of strain. Residual stress is computed from the measured residual strain. MORE INFORMATION >> |
| Application Note Q04: Forensic Analysis by X-ray DiffractionForensic analysis on drugs and pharmaceuticals using X-ray diffraction (XRD) identifies compound purity and composition. The analysis is non-destructive and sensitive to the presence of both polymorphs and contaminants. Polymorphs are substances which are chemically identical but have different chemical activity in certain environments, like dextrose and levulose (two forms of C 6H 12O 6). Only dextrose is useful to most life forms. A number of instruments can determine the difference between them, but XRD can do it in their solid (crystalline) forms.MORE INFORMATION >> | Application Note R01: Rietveld Analysis using RIQAS Rietveld Analysis may be considered a Fundamental Parameters program for XRD. It refines various parameters including lattice parameters, peak width and shape, and preferred orientation to derive a new diffraction pattern. Once the derived pattern is nearly identical to the original data various properties pertaining to the sample can be obtained, including: |
"AMIA Labs can provide specialty x-ray analysis, XRD, HRXRD, XRR & XRF for materials characterization."
Whether you are an engineer, scientist or just looking for x-ray services, AMIA Labs can provide you with specialty x-ray analysis, including XRD, HRXRD, XRR & XRF. Our most requested services include: Thin film analysis using high resolution (HRXRD); Reflectivity for film thickness and density (XRR); Polymer analysis - orientation and % crystallinity; Small-angle X-ray Scattering (SAXS) ; and, Qualitative and quantitative composition (Rietveld and RIR) and Microdiffraction (µ-XRD)
We offer texture (orientation) analysis of films, bulk materials and polymers, as well as residual stress on films and bulk materials. With our micro-beam, we can perform stress and texture experiments on areas as small as 50 microns. We also provide HRXRD (high resolution XRD) on films and epitaxial layers. We provide traditional XRD phase identification (qualitative, quantitative and Rietveld analysis), which can be coupled with XRF for quantitative elemental analysis. We specialize in Polymer analysis, including percent crystallinity, orientation and small angle scattering.
AMIA Labs X-ray Services |
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While X-ray diffraction (XRD) and X-ray fluorescence (XRF) are definitive non-destructive techniques for sub-surface analysis, large capital investments are required for equipment and trained personnel. Now, these analyses are affordable with the services of AMIA Labs. Our team has over 70 combined years of experience with X-ray diffraction and electron microscopy.
Using the latest technology available, coupled with our solid backgrounds in materials science, diffraction and fluorescence, we can analyze your most difficult samples, from large parts to very small spots. We can help you relate the results to material properties so you understand how process changes affect your products. With our complementary array of instrumentation, we can perform characterization usually within 24 to 48 hours.
Let AMIA Labs provide solutions to your manufacturing, research and development problems.
Application Notes are available on the following Topics: |