EAG - Evans Analytical Group
Specialists in Materials Characterization

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Evans Analytical Group® (EAG) is the world's leading, fully integrated, independent laboratory network. We provide global analytical services focused on surface analysis and materials characterization. We also provide the broadest range of electronic testing services to help bring your products to market.

Materials Characterization/
Surface Analysis Techniques
 
Release To Production (RTP) Services
Our international network of laboratories delivers world class analytical services directly to you. Our expertise in surface analysis, composition and contamination measurement, trace elemental analysis, microscopy and a wide range of other techniques can help you, no matter what high technology industry you are working in. From laser optics to biomedical devices, from raw materials to solar panels or high speed processors, our analytical services can help you develop new processes and materials faster, transfer those processes to production, qualify new production tools, solve production problems, and much more.
 
Evans Analytical Group’s Release-To-Production (RTP) team provides engineering service and support from chip tapeout to volume production. Services include: ATE test hardware and software development, reliability qualification, ESD & latch-up, PCB design, circuit edit/debug, yield enhancement, failure analysis, electron microscopy and equipment calibration and repair services.

AES
EDS
FIB
FTIR
GC/MS
GDMS
ICP-OES/MS
IGA
LA-ICP-MS
LEXES

Raman
RBS
Ion Channeling
HFS
NRA
PIXE
SEM
SIMS
SPM/AFM
TEM/STEM
TGA/DTA
TOF-SIMS
TXRF
XPS/ESCA
XRD
XRF
XRR
ATE Testing
Burn-in / Reliability Testing
ESD
PCB
FIB Circuit Edit
Failure Analysis
Advanced Microscopy
Equipment Calibration
Thermocouples
         
By Industry Announcements
Photovoltaic Solar Energy
Semiconductor
Biomedical
Lighting / LED
More >>

Meet EAG at the upcoming shows:
27 Aug - 2 Sep - European Conference on Silicon Carbide and Related Materials (ECSCRM)
6-10 Sep - European Photovoltaic Solar Energy Conference (EU PVSEC)
Larry Wang to present "Accurate SIMS Quantification of Dopants and Impurities in a-Si Solar Cell" - Monday, 6 Sep - Amorphous & Microcrystalline Silicon Solar Cells Session
Gary Mount to present "Characterization of CIGS Structure, Composition and Impurities: Investigation of Differences between High and Low Efficiency"
12-15 Sep - ICASI
Andrew Su to present "Depth Resolved Trace Element Analysis of Ni-base Superalloys using Fast Flow-Glow Discharge Mass Spectrometry (FF-GDMS)"
16 Sep - GSA Emerging Opportunities Expo & Conference
New Article: The Right Tool for the Right Job
New Literature:

Application Note: Rapid Defect Typing in GaN Using a Dedicated STEM
Materials Characterization for Lithium Ion Battery Technology
PV Materials Characterization for CdTe

Working Smarter™ Quick Links

Working Smarter Overview >>
Working Smarter Schedule >>
Upcoming Seminars - REGISTER TODAY
9 September - Dallas, TX
16 September - Sunnyvale, CA
7 October - Peabody, MA

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