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X-ray Diffraction for Medical Implants and Pharmeceuticals

XRD Medical Implant Lab Services

Our laboratries use X-ray analysis to characterize medical implants and pharmeceuticals. The medical implants can be heart valvues to joints. X-ray diffraction is used to characterize composition, orientation, and stress/strain at the molecular level. X-ray diffraction (XRD) is the definitive non-desctructive technique for sub-surface analysis. We offer the highest level of laboratory x-ray diffraction services as well as a full range of other related services.

Medical Implant Solutions

AMIA Labs uses x-ray analysis to characterize residual stress in cuffs for heart valves as well as the wire used for stents. In addition, AMIA Labs is able to use special microdiffraction techniques to obtain the stress on manufactured stents before and after expansion.

Medical Implant Solution : Stents

Our laboraories can measure the stress on the wire used in the manufacturor or stets used in angioplasty. AMIA Labs is able to use special microdiffraction techniques to obtain the stress on manufactured stents before and after expansion. The residual stress measured indicates where the material is situated in the stress/strain curve especially relaive to the elastic limit.

Medical Implant Solution : Joint replacement

Different kinds of materials are being used in replace joints. The materials that are either in use or being researched range from ceramic to metal. In these cases, especially in ceramics, multiple crystalographic phases may be present. X-ray diffraction can be used to probe these phases especially near edges or were points. The phases present, in ceramics, may represent a thermal treatment  which may or may not be desirable. For some materials crystallographic orientation may be imparted on the implant in order to strengthen the material in the direction of greatest stress. AMIA Labs offers this service as well.

Pharmaceutical: Percent crystallinity

While formulation gives multiple crystalline phases, dissolution rates may require a specific ratio of crystallograpic to amorphous material. X-ray diffraction can characterize this property in either loose powder or pellatized form.

 

 


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