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AMIA Labs uses X-ray analysis to characterize thin film material properties. Reflectometry (XRR) is used to determine thickness, density and roughness for single and multilayer stacks. XRR analysis can be performed on crystalline and amorphous materials. Composition, orientation(texture), and stress/strain at the molecular level can also be measured using x-ray diffraction (XRD).

Many specialized measurements are available for thin films depending upon the information needed. for example, crystallographic texture affects electrical and magnetic properties. Pole figures describe the orientation of crystallites in a material. Most metallic thin films exhibit fiber texture, which implies an axially-symmetric pole figure. AMIA Labs typically uses fiber texture plots to quantify primary texture strength, % random, and secondary orientations .

In-plane and out-of-plane stress, and normal micro-strain can influence magnetic properties of thin films and the reliability of devices. Mechanical stresses in interconnect lines, which arise from differences in thermal expansion between the metallic interconnect and the substrate that rigidly confines it, vary with different fabrication methods and aspect ratios. AMIA Labs has developed micro-beam stress techniques to characterize features as small as 50 µm on patterned wafers. Blanket film strain measurements are also available.

X-ray diffraction is used in may places in the pharmaceutical industry. From discovery through formulation to quality assurance, XRD plays an important role for the successful development, patenting and manufacturing of new and existing products. AMIA labs has the ability to collect data on milligrams of compound as well as the ability to look at final product. In addition, we have the ability to collect  variable temperature data for the study of polymorphs, hydration and decomposition. With a specialize stage we have the ability to use large beams on curved surfaces to handle tablets.

Medical implants such as joints, stents and heart valves, have been subjected to x-ray diffraction studies to probe stress on the parts. Some of the parts have had multiple points tested since the implants are subject to stresses in different areas depending on the application. With new material development including nanomaterials, porosity is measured by small angle scattering in order to determine the average particle and pore size and along with the the particle/pore size distribution.