AMIA Laboratory Equipment & Specifications
AMIA Laboratory Equipment & Specifications AMIA labs uses the latest in x-ray diffraction equipment. The equipment can be configured for a variety of standard measurements as well as non-standard measurements. For “point source” applications, such as micro-diffraction, a Bruker GADDS system with a 2D detector is used. This system is equipped with point collimators from 0.8 to 0.05mm with an incident beam graphite monochromator. Two sample stages are available. The first is a two-position Chi stage used for sample rotation in phi and manual positing in chi. The second stage is an XYZ stage used for mapping areas that are 100mmx100mm or less. Both stages can be rotated by a high precision omega stage. The GADDS system has a high-resolution 2D photon counting detector.
Laboratory Specifications |
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Bruker GADDS System
The latest addition is an Ultima III from Rigaku. This system is configured with a line source for standard and high resolution materials analysis. The system has variable slits, which are ideal for low angle diffraction. The stages include a six position sample changer, thin-film stage and a small-angle transmission stage. A unique feature of this instrument is the ability to collect in-plane data. A high temperature stage, which goes from room temperature to 1500 ° C, gives AMIA labs the ability to perform measurements to determine expansion coefficients, stress on thin films at high cycling temperatures, and temperature dependent dehydration and phase transitions. A two-bounce germanium monochromator makes the system suitable for high resolution rocking curves and reflectivity. A multilayer mirror for grazing incident studies or reflectomatry can also condition the incident beam. A specialized stage gives AMIA the unique ability to collect parallel beam data on curved pieces with the sampling effectiveness of a focusing geometry.
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