Elemental Analysis - XRF
Elemental Analysis - XRF
AMIA Laboratories specializes in X-ray analysis to probe process-property relationships for research and product development; improved reliability, performance, or product yield; as well as forensic and failure analysis. AMIA Laboratories uses X-ray diffraction and X-ray fluorescence to characterize material properties such as composition, orientation, and stress at the molecular level.
While X-ray diffraction (XRD) and X-ray fluorescence (XRF) are definitive non-destructive techniques for sub-surface analysis, large capital investments are required for equipment and trained personnel. Now, these analyses are affordable with the services of AMIA Laboratories. Our team has over 70 combined years of experience with X-ray diffraction and electron microscopy.
Using the latest technology available, coupled with our solid backgrounds in materials science, diffraction and fluorescence, we can analyze your most difficult samples, from large parts to very small spots. We can help you relate the results to material properties so you understand how process changes affect your products. With our complementary array of instrumentation, we can perform characterization usually within 24 to 48 hours.
X-ray fluorescence (XRF) analysis provides a quantitative elemental mass % for any material. Samples need to be prepared for analysis by grinding, pellet pressing or cut to fit into the XRF system. Sample sizes can vary which effects the ultimate accuracy or the measurment and the detection limits for trace elements. Depending on the sample matrix, all elements heavier than boron can be quantified, and the analysis can be done without the use of an external standard. Typically, XRF is an adjunct to XRD analysis if there are several isostructural materials, those that show the same set of d-spacings and also to determine the ratio of elemnts in alloys and minerals.
For bulk solids or liquids, this analysis provides the elemental mass percent of the elements present in the sample. It is an excellent complement to XRD (X-ray Diffraction), which determines the phases or compounds in a material (e.g. how the atoms are arranged), but cannot provide information about amorphous materials.
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